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SMC Best Practice Forum on 64 and 45 nm Design Challenges

November 18, 2008

The ITAC SMC Best Practice Forum on 64 and 45 nm Design Challenges is proving to be one of the best attended and best recieved forums we have produced in this series. So far over 50 microelectronics executives in Ottawa and Montreal have participated in the forum and given it great reviews.  The Toronto session is your last chance to join this discussion.  Don’t miss it.

Toronto Event - SMC Best Practice Forum - Fall Forum
“65 and 45nm Design Challenges: Is First Time Success a Thing of the Past?”

The participants will share their “war stories”, both good and bad, about designing into leading-edge/bleeding-edge process nodes.
Cormac O’Connell, a representative from TSMC, the largest foundry in the world, will describe the latest process technologies as well as the improved design environments available to ensure first-time success. 

Afshin Rezayee, Ph.D., Senior Scientist at Snowbush IP will share his real world experiences from a user’s viewpoint and all participants will share their own company’s experiences to provide a note of real-world caution.
Please join us in Toronto to gain better insight into a complex subject and enjoy valuable networking time with your colleagues in an informal sharing of best industry practices.

So, register now to ensure your place at this valuable Best Practice Forum!

    Tuesday, November 18, 2008
Cormac O’Connell, Senior Director of Engineering, TSMC
          Afshin Rezayee, Ph.D., Senior Scientist, Snowbush IP, a Division of Gennum
      Selam Kapetanovic, SE Mgr, NA Major Electronics & Platform Central, Platform Computing
    Platform Computing, 3760 14th Avenue, Markham, Ontario

        5:30 - 6:00 pm - Arrival and registration
          6:00 - 8:00 pm - Buffet Dinner, Presentations and Discussion
          ITAC Members - $45.00 + GST
          Non-members - $65.00 + GST    

Secure online registration now by clicking on this url: